Condition Monitoring: How to improve efficiency of our Renewable Systems by checking health of our Power Electronic SwitchesName : Swagat Das
Affliation : Assistant Professor
University : Kiit University
Country : India
There has been a substantial growth in the use of power electronic switching devices in recent years. The most routinely used power switches are IGBTs and MOSFETs. IGBTs are typically used in various vehicular applications, variable-frequency drives (VFDs), electronic ballasts and commercial cooling units. Larger IGBTs (1200V, 900A) are used in large low-voltage industrial motor drives, vehicular propulsion systems and large photovoltaic (PV) inverters. Degradation in Insulated Gate Bipolar Junction Transistor (IGBT) modules leads to reliability issues in high power applications. Like any other switch, IGBTs go through aging and failure, bringing down the system efficiency and often causing an entire system failure. Therefore, monitoring the state-of-health of IGBTs can be profitable in the long-run by ensuring higher system availability. When thermal and electrical stress factors are subjected to large IGBT modules, natural degradation takes place, and cracks are formed on Si surface where bond wires are attached to the die. These cracks and lift-offs eventually degrade the device performance leading to a complete failure. There are several methods to detect or predict precursor of failures of such devices. These methods would be compared and their advantages over one another would be discussed in details.